Manual and automated IC-layout tools are integrated in the PEYE Yield Finder analysis software. The combined yield-driven, standard-cell, design-optimization flow facilitates the application of design ...
A key limiting factor in standard cell based IC design is the standard cell library itself. This is because standard cell libraries don't offer the necessary variety of cells — in terms of ...
Detection and monitoring of the yield loss mechanisms and defects in product chips have been a subject of extensive efforts, resulting in multiple useful Design-for-Manufacturing (DFM) and ...
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