Load-board design is a critical part of any project that uses ATE to test integrated circuits. Load boards provide the interface between the ATE and the device under test (DUT). A properly designed ...

For those who have not dealt with the automotive side of electronics before, it comes as somewhat of a shock when you find out just how much extra you have to think about and how tough the testing and ...

Test facilities are beginning to implement real-time maintenance, rather than scheduled maintenance, to reduce manufacturing costs and boost product yield. Adaptive cleaning of probe needles and test ...

A new paradigm for semiconductor manufacturing test is coming. Unfortunately, it’s not yet completely defined, and most manufacturers still retain the traditional split between so-called front-end and ...

Parallel test is used for nearly every device produced by fabs and OSATs, but it can reduce yield and increase the cost of test boards and operations. This is a well-understood tradeoff for ensuring ...

Existing test solutions aren’t always suitable for the latest improvements in switching regulator technology. Transient load testing can address these inequities. In response to the recent ...