Semiconductor Engineering

Scalable End-To-End Test Solutions For Today’s Complex SoCs

Left-shifting DFT, scalable tests from manufacturing to the field, enabling system-level tests for in-field debug.
Seeking Alpha

Synopsys Advances Silicon Lifecycle Management to Accelerate Data Transport and Significantly Reduce Test Time

New Streaming Fabric Technology Enables Real-Time Silicon Health Monitoring for Reliable End Device Operation "Enfabrica is building leading-edge silicon at the heart of hyper-distributed compute ...
Electronic Design

Test And Yield Management Converge

Learning how to improve IC-fabrication yields through analysis of production test can be extremely valuable. The combination of Synopsys’ Odyssey design-for-test (DFT) module and its TetraMAX ...
Electronic Design

Synopsys addresses FinFET defects, embedded-flash test at ITC

Synopsys chose the International Test Conference to highlight two significant initiatives: defect-detection enhancements in TetraMAX ATPG through slack-based cell-aware test capability, and a new STAR ...