The Statistical Process Control Calculator (SPCC) aids in the prediction and analysis of process yield. The calculator can be used with an HP® 50g calculator or a free PC emulator. Steve Edwards, an ...

This course addresses the basic theory behind Statistical Process Control (SPC), a method used in monitoring and controlling the quality of a process through statistical analysis to reduce variation.

There is a boom in the volume of semiconductor devices being manufactured, and the boom is primarily credited to the proliferation of Internet of Things (IoT)-based devices in our daily lives. IoT ...

Performance metrics for processes are an area of much regulatory interest currently. There isn’t always a readily available clear definition of what is needed, however, and guidance from regulators is ...

It is no longer a mystery for designers and manufacturers of 45nm chips that higher process variability negatively impacts design performance, predictability and parametric yield. Manufacturing and ...

To protect drug product and drug substances, statistical methods to identify critical process parameters and critical material attributes, as well as and approaches to control them, are needed. A key ...