What is Scanning Ion Conductance Microscopy? Scanning Ion Conductance Microscopy (SICM) is a non-contact scanning probe microscopy technique that enables high-resolution imaging of living cells and ...

Atomic force microscopy (AFM) is a type of scanning probe microscopy that is used to see and measure surface topography, conduct force measurements or manipulate a sample’s surface. It can have nearly ...

Over the past decade, demand for nano-electrical characterization has rapidly increased due to the continuous miniaturization of electronic devices. The semiconductor and microelectronics industries ...

In recent decades, there has been an increased desire to miniaturize electronics, which, in turn, has enhanced the demand for nano-electrical characterization methods. It is crucial that an ...

Scanning thermal microscopy (SThM) has emerged as a pivotal nanoscale characterisation tool to elucidate local thermal properties in advanced materials. By utilising a specialised probe integrated ...

Scanning probe microscopy (SPM) is a set of advanced methods for surface analysis. The recent advances in SPM of metals, polymers, insulating, and semiconductive materials are primarily due to the ...