Material fabrication processes can gradually create changes in the material’s final properties; thus, to verify the material’s final quality and comprehend any inconsistencies, scientists need a ...
HILLSBORO, Ore., Nov. 7, 2019 /PRNewswire/ -- Thermo Fisher Scientific today announced the Thermo Scientific Aquilos 2 Cryo-FIB, a DualBeam system dedicated to the preparation of thin, ...
In this interview, we speak to Martin Slama at TESCAN, who describes sample preparation using high current plasma FIB SEM. Can you describe what high current plasma FIB-SEM is? The high current plasma ...
The FIB is a highly effective piece of technology that can accelerate the specimen preparation processes for use in a SEM or a TEM through the application of its micro-machining, sectioning, and ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
Silicon carbide (SiC) is a crystalline material utilized to develop a wide array of electronic devices, including transistors and other high-power, high-frequency, and high-temperature devices. As ...
Unlike the electron beam used in scanning and transmission electron microscopy (SEM, TEM), the beam in a focused ion beam system (FIB) is composed of gallium (Ga) ions. The ions forming the structure ...
In transmission electron microscopy (TEM), where the electron beam passes through the sample to be directly imaged on the detector below, it is often necessary to support the thin samples on a grid.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results
Feedback