Observations at the nanoscale can provide profound insights into materials science. Yet, the characterization of beam-sensitive and reactive materials has proven challenging. In order to address this ...
The FIB is a highly effective piece of technology that can accelerate the specimen preparation processes for use in a SEM or a TEM through the application of its micro-machining, sectioning, and ...
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The Hitachi FB-2000A FIB uses a beam of focused high-energy (30 kV) gallium ions to remove material in a very controlled manner from inorganic specimens. The FB-2000A is a single beam system; that is, ...
CASI houses the Thermo Scientific Helios 5 UX DualBeam Focus Ion Beam/Scanning Electron Microscope (FIB-SEM) to accelerate nanotechnology research and development at the University of Wyoming. This ...
TEM lamella preparation is essential for almost any FIB-SEM user. Go beyond conventional TEM sample preparation with the ZEISS Crossbeam FIB-SEM. Users can maximize their productivity for TEM lamella ...
Thermo Fisher Scientific today announced the Thermo Scientific Aquilos 2 Cryo-FIB, a DualBeam system dedicated to the preparation of thin, electron-transparent samples from biological specimens. It ...
The demands of processing speed in microelectronics is pushing the industry to develop smaller and more advanced chip architectures. The nanoscale features on modern chips are difficult to reliably ...
With the inventions of transmission electron microscopy (TEM) in 1931 and scanning electron microscopy (SEM) shortly after in 1937, scientists gained an unprecedented ultrastructural view of the ...
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