Custom designed system applies Industry 4.0 concepts to minimize downtime and cost of ownership while improving automation, quality, and yield in semiconductor testing operations Combines advanced ...
Representing the building blocks of a complete PXI system, enabling better test capabilities, it leverages engineers’ access ...
TOKYO, Dec. 11, 2020 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) has announced that cumulative shipments of the company's T6391 display driver ...
Based on a new NPower open architecture and XTOS (eXtendable Test Operating System) software, the Sapphire NP automated test equipment (ATE) reduces cost by being ...
TOKYO, Japan, Sept. 01, 2025 (GLOBE NEWSWIRE) -- Leading semiconductor test equipment supplier Advantest Corporation (TSE: 6857) will feature its leading-edge IC test solutions at SEMICON India 2025, ...
During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...
Instron ® has released the new AT3 Floor Model testing system, an unrivaled option in automated metals testing that delivers up to 300 kN of force within a compact footprint for a broad range of ...
The pool of companies will compete for task orders to provide computer-controlled diagnostic equipment to test military aircraft and weapons systems. Thirty-three companies won spots on a $980 million ...