Automatic test-pattern generation (ATPG) has played a key role in semiconductor logic test, but several trends driving the need for semiconductor test quality are challenging traditional ATPG tools.

Chipmakers worldwide consider Automatic Test Pattern Generation (ATPG) their go-to method for achieving high test coverage in production. ATPG generates test patterns designed to detect faults in the ...

WILSONVILLE, Ore., May 18, 2015 -- Mentor Graphics Corp. (NASDAQ: MENT) today announced that Mellanox Technologies has standardized on the new Mentor® Tessent® Hierarchical ATPG solution to manage the ...

Moore’s law has been the standard reference for semiconductor scaling. It roughly says that semiconductor design sizes, fueled by technology improvements, double every two years. Consequentially, the ...

In trading on Wednesday, shares of ATP Oil & Gas Corp (NASD: ATPG) entered into oversold territory, changing hands as low as $6.08 per share. We define oversold territory using the Relative Strength ...

Low-power design and fast testing at the fab are not happy bedfellows. As Giri Podichetty of Mentor Graphics explains at Semiwiki and in a white paper, “the goal of automatic test pattern generation ...

Design for Test (DFT) is a name for design techniques that add certain testability features to a microelectronic hardware product design. The premise of the added features is that they make it easier ...

Advanced ATPG products support simultaneous analysis of multiple fault models, leverage multi-threading and on-chip compression to improve quality and reduce turnaround time and costs of nanometer ICs ...

The trend in semiconductors leads to more IC test data volume, longer test times, and higher test costs. Embedded deterministic test (EDT) has continued to deliver more compression, which has been ...

The very process of testing digital circuits routinely increases their dynamic power consumption to levels far exceeding their power specification. If the power consumption is great enough, it can ...